Dual-probe scanning tunneling microscope:Measuring a carbon nanotube ring transistor

Hiroyuki Watanabe Corporate Research Center
Chikara Manabe 同上
Taishi Shigematsu 同上
Masaaki Shimizu 同上

 We have constructed a dual-probe scanning tunneling microscope (D-STM). We used multiwall carbon nanotubes [(NT), diameter: ~10 nm] as STM probes. The D-STM allows us to elucidate the electric property of a sample with a spatial resolution of ~1 nm. Using this system, we have measured the current-voltage curves of a single NT ring as a transistor. The curves show the possibility of nanometer-scale electronic circuits composed of NT devices. (C) 2001 American Institute of Physics. [DOI: 10.1063/1.1371529]

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